Thermal-Aware Design for Approximate DNN Accelerators

被引:13
|
作者
Zervakis, Georgios [1 ]
Anagnostopoulos, Iraklis [2 ]
Salamin, Sami [1 ]
Spantidi, Ourania [2 ]
Roman-Ballesteros, Isai [3 ]
Henkel, Joerg [1 ]
Amrouch, Hussam [3 ]
机构
[1] Karlsruhe Inst Technol KIT, Dept Comp Sci, Chair Embedded Syst CES, D-76131 Karlsruhe, Germany
[2] Southern Illinois Univ Carbondale, Sch Elect Comp & Biomed Engn, Carbondale, IL 62901 USA
[3] Univ Stuttgart, Elect Engn Fac, Chair Semicond Test & Reliabil STAR Comp Sci, D-70569 Stuttgart, Germany
关键词
Approximate computing; deep neural networks; neural processing unit; reliability; systolic MAC array; temperature; thermal design; VLSI; MULTIPLIERS;
D O I
10.1109/TC.2022.3141054
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Recent breakthroughs in Neural Networks (NNs) have made DNN accelerators ubiquitous and led to an ever-increasing quest on adopting them from Cloud to edge computing. However, state-of-the-art DNN accelerators pack immense computational power in a relatively confined area, inducing significant on-chip power densities that lead to intolerable thermal bottlenecks. Existing state of the art focuses on using approximate multipliers only to trade-off efficiency with inference accuracy. In this work, we present a thermal-aware approximate DNN accelerator design in which we additionally trade-off approximation with temperature effects towards designing DNN accelerators that satisfy tight temperature constraints. Using commercial multi-physics tool flows for heat simulations, we demonstrate how our thermal-aware approximate design reduces the temperature from 139 degrees C, in an accurate circuit, down to 79 degrees C. This enables DNN accelerators to fulfill tight thermal constraints, while still maximizing the performance and reducing the energy by around 75% with a negligible accuracy loss of merely 0.44% on average for a wide range of NN models. Furthermore, using physics-based transistor aging models, we demonstrate how reductions in voltage and temperature obtained by our approximate design considerably improve the circuit's reliability. Our approximate design exhibits around 40% less aging-induced degradation compared to the baseline design.
引用
收藏
页码:2687 / 2697
页数:11
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