Resonant soft x-ray reflectivity of Me/B4C multilayers near the boron K edge

被引：5

作者：

Ksenzov, Dmitriy ^{[1
]}

Schlemper, Christoph ^{[1
]}

Pietsch, Ullrich ^{[1
]}

机构：

[1] Univ Siegen, D-57068 Siegen, Germany

来源：

APPLIED OPTICS | 2010年 / 49卷 / 25期

关键词：

OPTICAL-PROPERTIES; RANGE; FILMS; CONSTANTS; CARBIDE;

D O I：

10.1364/AO.49.004767

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Energy dependence of the optical constants of boron carbide in the short period Ru/B4C and Mo/B4C multilayers (MLs) are evaluated from complete reflectivity scans across the boron K edge using the energy-resolved photon-in-photon-out method. Differences between the refractive indices of the B4C material inside and close to the surface are obtained from the peak profile of the first order ML Bragg peak and the reflection profile near the critical angle of total external reflection close to the surface. Where a Mo/B4C ML with narrow barrier layers appears as a homogeneous ML at all energies, a Ru/B4C ML exhibits another chemical nature of boron at the surface compared to the bulk. From evaluation of the critical angle of total external reflection in the energy range between 184 and 186eV, we found an enriched concentration of metallic boron inside the Ru-rich layer at the surface, which is not visible in other energy ranges. (c) 2010 Optical Society of America

引用

页码：4767 / 4773

页数：7

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