A quick electrical inspection method of solder joint quality for LED products

被引：1

作者：

Zhang, Jianhua ^{[1
,3
]}

Que, Xiufu ^{[1
,3
]}

Liu, Yanan ^{[2
,3
]}

Chen, Weining ^{[4
]}

Tao, Guoqiao ^{[4
]}

Yang, Lianqiao ^{[2
,3
]}

机构：

[1] Shanghai Univ, Sch Mech Engn & Automat, Shanghai 200072, Peoples R China

[2] Shanghai Univ, Sch Mat Sci & Engn, Shanghai 20072, Peoples R China

[3] Shanghai Univ, Minist Educ, Key Lab Adv Display & Syst Applicat, Shanghai 200072, Peoples R China

[4] Philips China Investment Co Ltd, Shanghai 200233, Peoples R China

来源：

MEASUREMENT SCIENCE AND TECHNOLOGY | 2016年 / 27卷 / 06期

关键词：

LED; K coefficient; heating curve; quick electric test; THERMAL-RESISTANCE; IDENTIFICATION; TEMPERATURE;

D O I：

10.1088/0957-0233/27/6/065005

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Solder joint qualities of light-emitting diodes (LED) lamps have a significant effect on their lifetime. Due to variations in LEDs, the product lifetime is determined by the lowest performing component of the product when multi-LEDs are used. In this paper, we propose a quick electrical inspection method of solder joint quality for LED products, which is obtained by the heating curve measurement for a short time with the forward voltage as a temperature sensitive parameter. The utility of this quick inspection method is verified by the measurement of a solder voids ratio based on the most commonly used approaches in the industry-x-ray. The proposed method is cost effective and only needs around 1-5 s for each LED, which is about one third of the x-ray. Therefore, the quick electrical test method is both meaningful and promising especially when carrying out quality tests on large quantities of solder and can be a highly recommended method to be adopted by the LED lighting industry.

引用

页数：6

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