Fabrication of finely controlled micro groove by focused ion beam for high-Tc superconducting Josephson junctions

被引:4
作者
Yutani, N [1 ]
Suzuki, K [1 ]
Enomoto, Y [1 ]
机构
[1] ISTEC, Superconduct Res Lab, Koto Ku, Tokyo 135, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1999年 / 38卷 / 3A期
关键词
focused ion beam; milling; Josephson junction; high-temperature superconductor; YBCO; AFM; I-V characteristics;
D O I
10.1143/JJAP.38.1375
中图分类号
O59 [应用物理学];
学科分类号
摘要
For Josephson junctions using a narrow groove on a substrate etched by a focused ion beam (FIB), it is important to control the shape of the groove. We have developed the FIB milling method which has flexibility to produce a variety of groove shapes. The groove shapes are finely controlled by changing the etching time at each line of beam scan under computer control. V-shape grooves with different widths between 205 nm and 650 nm have been formed with the same slope angle on an MgO substrate. A Josephson junction fabricated on this groove shows RSJ-type I-V curves for a 300 nm thick c-axis oriented YBa2Cu3O7 (YBCO) film. The top surface profile of the YBCO film has the same V-shape as the groove on the substrate.
引用
收藏
页码:1375 / 1379
页数:5
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