Pulsed laser deposition of quantum size bismuth films

被引：0

作者：

Shubnii, GY ^{[1
]}

Zherikhin, AN ^{[1
]}

Prokopov, EV ^{[1
]}

Tskhovrebov, AM ^{[1
]}

Zherikhina, LN ^{[1
]}

Voronov, VV ^{[1
]}

机构：

[1] Russian Acad Sci, Laser Res Ctr, NICTL, Troitsk 142092, Moscow Region, Russia

来源：

6TH INTERNATIONAL CONFERENCE ON INDUSTRIAL LASERS AND LASER APPLICATIONS '98 | 1999年 / 3688卷

关键词：

D O I：

10.1117/12.337530

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Thin bismuth films were deposited by pulsed laser deposition technique. The conductivity of films was measured in-situ during deposition process. Quantum oscillations of conductivity were observed. Films were investigated by photoelectron spectroscopy technique. Red shift of outer work function for about 1.5 eV for thin films was observed.(1)

引用

页码：330 / 334

页数：3

共 21 条

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