Correlation between predictive and descriptive models to characterize the passive film - Study of pure chromium by electrochemical impedance spectroscopy
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作者:
Boissy, C.
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Univ Lyon, INSA LYON, MATEIS UMR CNRS 5510, F-69621 Villeurbanne, FranceUniv Lyon, INSA LYON, MATEIS UMR CNRS 5510, F-69621 Villeurbanne, France
Boissy, C.
[1
]
Ter-Ovanessian, B.
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机构:
Univ Lyon, INSA LYON, MATEIS UMR CNRS 5510, F-69621 Villeurbanne, FranceUniv Lyon, INSA LYON, MATEIS UMR CNRS 5510, F-69621 Villeurbanne, France
Ter-Ovanessian, B.
[1
]
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Mary, N.
[1
]
Normand, B.
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机构:
Univ Lyon, INSA LYON, MATEIS UMR CNRS 5510, F-69621 Villeurbanne, FranceUniv Lyon, INSA LYON, MATEIS UMR CNRS 5510, F-69621 Villeurbanne, France
Normand, B.
[1
]
机构:
[1] Univ Lyon, INSA LYON, MATEIS UMR CNRS 5510, F-69621 Villeurbanne, France
Passive metals play a key role in many fields. The numerous phenomena affecting the behavior of the film are linked to the main issue that help us to understand the processes of passivation. The description of Electrochemical Impedance Spectroscopy (EIS) data allows us to evaluate kinetic parameters, but there are many models offered and it is difficult to select one to fit EIS data. Mass transport is a significant factor when characterizing the passive film and it is a good way of identifying models. This study proposes a methodology allowing us to choose the most appropriate model and to determine objectively if the mass transport has to be taken into account. The mass transport coefficient of the point defect through oxide is determined through the Point Defect Model. Knowing the thickness of the oxide, through Xray Photoelectron Spectroscopy (XPS) analysis, the time constant of the transport is determined. Based on this value, a descriptive model is selected avoiding the over-parameterization of the EIS data. This methodology is used in acidic solutions at 30 degrees C and 80 degrees C on pure chromium considered as model material and demonstrates that the mass transport has to be taken into account at 80 degrees C. (C) 2015 Elsevier Ltd. All rights reserved.
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CEA, DEN, DPC, SCCME, F-91191 Gif Sur Yvette, FranceCEA, DEN, DPC, SCCME, F-91191 Gif Sur Yvette, France
Bataillon, C.
;
Bouchon, F.
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机构:
Univ Blaise Pascal, Clermont Univ, Math Lab, F-63000 Clermont Ferrand, France
CNRS, Math Lab, UMR 6620, F-63177 Aubiere, FranceCEA, DEN, DPC, SCCME, F-91191 Gif Sur Yvette, France
Bouchon, F.
;
Chainais-Hillairet, C.
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机构:
Univ Blaise Pascal, Clermont Univ, Math Lab, F-63000 Clermont Ferrand, France
CNRS, Math Lab, UMR 6620, F-63177 Aubiere, FranceCEA, DEN, DPC, SCCME, F-91191 Gif Sur Yvette, France
Chainais-Hillairet, C.
;
Desgranges, C.
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CEA, DEN, DPC, SCCME, F-91191 Gif Sur Yvette, FranceCEA, DEN, DPC, SCCME, F-91191 Gif Sur Yvette, France
Desgranges, C.
;
Hoarau, E.
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h-index: 0
机构:
ANDRA DS, F-92298 Chatenay Malabry, FranceCEA, DEN, DPC, SCCME, F-91191 Gif Sur Yvette, France
Hoarau, E.
;
Martin, F.
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CEA, DEN, DPC, SCCME, F-91191 Gif Sur Yvette, FranceCEA, DEN, DPC, SCCME, F-91191 Gif Sur Yvette, France
Martin, F.
;
Perrin, S.
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CEA, DEN, DPC, SCCME, F-91191 Gif Sur Yvette, FranceCEA, DEN, DPC, SCCME, F-91191 Gif Sur Yvette, France
Perrin, S.
;
Tupin, M.
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CEA, DEN, DMN, SEMI,LM2E, F-91191 Gif Sur Yvette, FranceCEA, DEN, DPC, SCCME, F-91191 Gif Sur Yvette, France
Tupin, M.
;
Talandier, J.
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h-index: 0
机构:
ANDRA DS, F-92298 Chatenay Malabry, FranceCEA, DEN, DPC, SCCME, F-91191 Gif Sur Yvette, France
机构:
CEA, DEN, DPC, SCCME, F-91191 Gif Sur Yvette, FranceCEA, DEN, DPC, SCCME, F-91191 Gif Sur Yvette, France
Bataillon, C.
;
Bouchon, F.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Blaise Pascal, Clermont Univ, Math Lab, F-63000 Clermont Ferrand, France
CNRS, Math Lab, UMR 6620, F-63177 Aubiere, FranceCEA, DEN, DPC, SCCME, F-91191 Gif Sur Yvette, France
Bouchon, F.
;
Chainais-Hillairet, C.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Blaise Pascal, Clermont Univ, Math Lab, F-63000 Clermont Ferrand, France
CNRS, Math Lab, UMR 6620, F-63177 Aubiere, FranceCEA, DEN, DPC, SCCME, F-91191 Gif Sur Yvette, France
Chainais-Hillairet, C.
;
Desgranges, C.
论文数: 0引用数: 0
h-index: 0
机构:
CEA, DEN, DPC, SCCME, F-91191 Gif Sur Yvette, FranceCEA, DEN, DPC, SCCME, F-91191 Gif Sur Yvette, France
Desgranges, C.
;
Hoarau, E.
论文数: 0引用数: 0
h-index: 0
机构:
ANDRA DS, F-92298 Chatenay Malabry, FranceCEA, DEN, DPC, SCCME, F-91191 Gif Sur Yvette, France
Hoarau, E.
;
Martin, F.
论文数: 0引用数: 0
h-index: 0
机构:
CEA, DEN, DPC, SCCME, F-91191 Gif Sur Yvette, FranceCEA, DEN, DPC, SCCME, F-91191 Gif Sur Yvette, France
Martin, F.
;
Perrin, S.
论文数: 0引用数: 0
h-index: 0
机构:
CEA, DEN, DPC, SCCME, F-91191 Gif Sur Yvette, FranceCEA, DEN, DPC, SCCME, F-91191 Gif Sur Yvette, France
Perrin, S.
;
Tupin, M.
论文数: 0引用数: 0
h-index: 0
机构:
CEA, DEN, DMN, SEMI,LM2E, F-91191 Gif Sur Yvette, FranceCEA, DEN, DPC, SCCME, F-91191 Gif Sur Yvette, France
Tupin, M.
;
Talandier, J.
论文数: 0引用数: 0
h-index: 0
机构:
ANDRA DS, F-92298 Chatenay Malabry, FranceCEA, DEN, DPC, SCCME, F-91191 Gif Sur Yvette, France