Understanding γ-MnO2 by molecular modeling

被引:31
作者
Hill, MR
Freeman, CM
Rossouw, MH
机构
[1] Accelrys GmbH, D-82008 Unterhaching, Germany
[2] Accelrys Inc, San Diego, CA 92121 USA
[3] Delta EMD Pty Ltd, ZA-1200 Nelspruit, South Africa
关键词
gamma-MnO2; EMD; CMD; de Wolff disorder; microtwinning; point defects; X-ray diffraction; molecular modeling;
D O I
10.1016/S0022-4596(03)00393-1
中图分类号
O61 [无机化学];
学科分类号
070301 ; 081704 ;
摘要
De Wolff disorder, microtwinning, and point defects which are characteristic for gamma-MnO2 have been studied using molecular modeling. Particular attention was paid to the effects these defects have on the X-ray diffraction (XRD) pattern. Comparisons with observed XRD patterns allow identification of structural features in chemical (CMD) and electrochemical (EMD) manganese dioxide. The major factor determining the structure of gamma-MnO2 is de Wolff disorder. CMD materials are characterized by a larger percentage of pyrolusite while EMD materials contain more ramsdellite. Microtwinning occurs to a larger extent in EMD than in CMD materials. EMD materials are also higher in energy. (C) 2003 Elsevier Inc. All rights reserved.
引用
收藏
页码:165 / 175
页数:11
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