Improved compact model for high speed SiGe HBT breakdown

被引:0
作者
Xu, Hongya [1 ]
Kasper, Erich [1 ]
机构
[1] Univ Stuttgart, Inst Halbleitertech, D-70569 Stuttgart, Germany
来源
2008 IEEE TOPICAL MEETING ON SILICON MONOLITHIC INTEGRATED CIRCUITS IN RF SYSTEMS, DIGEST OF PAPERS | 2008年
关键词
SiGe; HBT; model; impact ionization; dead space; avalanche effect; compact model; ADS;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
High speed SiGe-HBTs provide only a small V(CE) voltage variation between the saturation region (low VCE) and the breakdown at also rather low values. For high speed circuits it is unavailable to drive the SiGe HBT near the breakdown limits. In compact models used for circuit design the breakdown is described by the week avalanche approximation which is unsufficient for modern HBTs with short collector regions. We propose a more refined approximation which is based on the deed space concept for electrons to be accelerated up to the impact ionization energy. The model is implemented in the VBIC compact model.
引用
收藏
页码:203 / 205
页数:3
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