Real-time observation of epitaxial graphene domain reorientation

被引:30
作者
Rogge, Paul C. [1 ,2 ]
Thuermer, Konrad [3 ]
Foster, Michael E. [3 ]
McCarty, Kevin F. [3 ]
Dubon, Oscar D. [1 ,2 ]
Bartelt, Norman C. [3 ]
机构
[1] Univ Calif Berkeley, Dept Mat Sci & Engn, Berkeley, CA 94720 USA
[2] Univ Calif Berkeley, Lawrence Berkeley Natl Lab, Div Mat Sci, Berkeley, CA 94720 USA
[3] Sandia Natl Labs, Livermore, CA 94550 USA
基金
美国能源部; 美国国家科学基金会;
关键词
CRYSTAL MONOLAYER GRAPHENE; GRAIN-BOUNDARIES; BORON-NITRIDE; COPPER FOILS; GROWTH; SYMMETRY;
D O I
10.1038/ncomms7880
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Graphene films grown by vapour deposition tend to be polycrystalline due to the nucleation and growth of islands with different in-plane orientations. Here, using low-energy electron microscopy, we find that micron-sized graphene islands on Ir(111) rotate to a preferred orientation during thermal annealing. We observe three alignment mechanisms: the simultaneous growth of aligned domains and dissolution of rotated domains, that is, 'ripening'; domain boundary motion within islands; and continuous lattice rotation of entire domains. By measuring the relative growth velocity of domains during ripening, we estimate that the driving force for alignment is on the order of 0.1 meV per C atom and increases with rotation angle. A simple model of the orientation-dependent energy associated with the moire corrugation of the graphene sheet due to local variations in the graphene-substrate interaction reproduces the results. This work suggests new strategies for improving the van der Waals epitaxy of 2D materials.
引用
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页数:6
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