Efficient and Quantitative Characterization of Carbon Nanotube Thin Films

被引：0

作者：

Zhao, Jie ^{[1
,2
]}

Huang, Qi ^{[1
,2
]}

Liu, Fang ^{[1
,2
]}

Liang, Xuelei ^{[1
,2
]}

Shen, Lijun ^{[3
]}

机构：

[1] Peking Univ, Key Lab Phys & Chem Nanodevices, Beijing, Peoples R China

[2] Peking Univ, Dept Elect, Beijing, Peoples R China

[3] Chinese Acad Sci, Inst Automat, Beijing, Peoples R China

来源：

2018 9TH INTHERNATIONAL CONFERENCE ON COMPUTER AIDED DESIGN FOR THIN-FILM TRANSISTORS (CAD-TFT) | 2018年

关键词：

carbon nanotube; thin films; uniformity; image recognition;

D O I：

暂无

中图分类号：

TP39 [计算机的应用];

学科分类号：

081203 ; 0835 ;

摘要：

Quantitative characterization of the Carbon nanotube (CNT) thin film quality is essential for the development of carbon nanotube thin film transistors (CNT-TFTs). In this paper, we report a density characterization method for CNT thin films based on image processing of scanning electron microscope (SEM) images of CNT thin films. The density and uniformity of large area CNT films can be evaluated quantitatively, accurately and high efficiently by this method.

引用

页码：9 / 9

页数：1