Loss phenomena in the AC quantum Hall effect

被引：13
|
作者：
Schurr, J [1 ]
Melcher, J
von Campenhausen, A
Pierz, K
Hein, G
Ahlers, FJ
机构：
[1] Phys Tech Bundesanstalt, D-38116 Braunschweig, Germany
[2] Infineon Technol, D-81541 Munich, Germany
来源：
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 2001年 / 50卷 / 02期
关键词：
coaxial ac bridge; impedance; quantum Hall effect; low-frequency resistance;
D O I：
10.1109/19.918105
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We investigated the ac quantum Hall effect of several GaAs-based samples. The influence of temperature, current, and frequency was measured for the plateaux i = 2, Some measurements of the plateaux i = 4 were performed to determine the scaling behavior with respect to i, The observed relations tan be described by simple formulas which provide some insight into the at quantum Nail effect.
引用
收藏
页码：214 / 217
页数：4
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