Flexible, transparent resistive switching device based on topological insulator Bi2Se3-organic composite

被引:17
作者
Das, Biswajit [1 ]
Sarkar, Pranab K. [2 ]
Das, Nirmalya S. [1 ,4 ]
Sarkar, Samrat [3 ]
Chattopadhyay, Kalyan K. [1 ,3 ]
机构
[1] Jadavpur Univ, Dept Phys, Thin Film & Nano Sci Lab, Kolkata 700032, India
[2] Assam Univ, Dept Appl Sci & Humanities, Silchar 788010, India
[3] Jadavpur Univ, Sch Mat Sci & Nanotechnol, Kolkata 700032, India
[4] Techno India Batanagar, Dept Basic Sci & Humanities, Kolkata 700141, India
关键词
MEMORY DEVICES; NONVOLATILE MEMORY; BI2SE3; PEROVSKITE; NANOSHEETS; BEHAVIOR; POLYMER; STATE;
D O I
10.1063/1.5042332
中图分类号
O59 [应用物理学];
学科分类号
摘要
Two-dimensional topological insulator bismuth selenide (Bi2Se3) nanosheets (NSs) embedded in poly-methyl methacrylate (PMMA) are employed for the first time for the resistive switching (RS) application. Hexagonal 2D Bi2Se3 NSs are synthesized by a simple solvothermal method and combine with PMMA at different weight percentages of 2D Bi2Se3. Field emission scanning electron microscopy and transmission electron microscopy along with other characterizations such as X-ray photoelectron spectroscopy and Raman spectroscopy were performed for the characterization of Bi2Se3 @PMMA hybrid system. The composite was deposited on a transparent, flexible polyethylene terephthalate substrate to form Ag/Bi2Se3@PMMA/indium doped tin oxide memory cell. I-V characteristics of the device revealed a stable and non-volatile memory effect. The device shows a significantly high resistance (R-HRS/R-LRS) ratio, more than 10(3), high retention time (more than 9000 s) with high reproducibility over a large number of (10(5)) ac cycles. From the experimental data, RS performances are explained by using a charge trapping-detrapping mechanism. Owing to the increasing interest in flexible electronics, bending tests are carried out at various bending diameters (10-30 mm) to show the mechanical robustness of the proposed device. Published by AIP Publishing.
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页数:8
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