Research on the quantitative analysis of subsurface defects for non-destructive testing by lock-in thermography

被引:44
作者
Liu Junyan [1 ]
Tang Qingju [1 ]
Liu Xun [1 ]
Wang Yang [1 ]
机构
[1] Harbin Inst Technol, Sch Mechatron Engn, Harbin 150001, Peoples R China
关键词
Lock-in thermography; PDE; ANN; Differential normalised phase; Quantification;
D O I
10.1016/j.ndteint.2011.09.002
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
This paper describes the quantitative analysis of the boundary, location and depth of subsurface defects by lock-in thermography. The phase difference between defective areas and non-defective areas illustrates the qualitative analysis of the boundary and the location of the subsurface defect. In order to accurately estimate the size, location and depth of the defects, the phase is normalised, the heat transfer partial differential equation (PDE) model is used to filter the noise of normalised phase image and the differential normalised phase profile is employed to determine the boundary and location of the defect. The profile of the differential normalised phase distribution has maximum, minimum and zero points that help to quantitatively determine the boundary and location of the subsurface defect. An artificial neural network (ANN) is proposed to determine the depth of the subsurface defect. Experimental results for a steel plate, a carbon fibre-reinforced polymer (CFRP) sheet-foam sandwich, and honeycomb structure composites with artificial subsurface defects show good agreement with the actual values. (C) 2011 Elsevier Ltd. All rights reserved.
引用
收藏
页码:104 / 110
页数:7
相关论文
共 8 条
[1]  
ACHENBACH JD, 1988, SOLID MECH RES QUANT
[2]   THERMAL WAVE IMAGING WITH PHASE SENSITIVE MODULATED THERMOGRAPHY [J].
BUSSE, G ;
WU, D ;
KARPEN, W .
JOURNAL OF APPLIED PHYSICS, 1992, 71 (08) :3962-3965
[3]  
Carlomagno G. M., 1976, P 3 BIANN EXCH ST LO, V2, P33
[4]   Quantitative determination of a subsurface defect of reference specimen by lock-in infrared thermography [J].
Choi, Manyong ;
Kang, Kisoo ;
Park, Jeonghak ;
Kim, Wontae ;
Kim, Koungsuk .
NDT & E INTERNATIONAL, 2008, 41 (02) :119-124
[5]   Defect detection in aircraft composites by using a neural approach in the analysis of thermographic images [J].
D'Orazio, T ;
Guaragnella, C ;
Leo, M ;
Spagnolo, P .
NDT & E INTERNATIONAL, 2005, 38 (08) :665-673
[6]   Research on thermal wave processing of lock-in thermography based on analyzing image sequences for NDT [J].
Liu Junyan ;
Wang Yang ;
Dai Jingmin .
INFRARED PHYSICS & TECHNOLOGY, 2010, 53 (05) :348-357
[7]  
Maldague XPV, 2001, WILEY MICRO, pXV
[8]  
SAINTEY MB, 1995, J PHYS D, V28, P2546