共 22 条
[2]
[Anonymous], 2015, 17 INT C METR, DOI DOI 10.1051/METROLOGY/20150013003
[3]
[Anonymous], 2634 VDIVDE
[4]
Metrological evaluation of Structured Light 3D scanning system with an optical feature-based gauge
[J].
MANUFACTURING ENGINEERING SOCIETY INTERNATIONAL CONFERENCE 2017 (MESIC 2017),
2017, 13
:526-533
[7]
Cuesta E., 2014, Spanish Patent, Patent No. [ES2490940 B1, 2490940]
[8]
Dury M.R., 2015, P 30 ANN M AM SOC PR, P419
[9]
Escalera A, 2010, REV IBEROAMERICANA A, V4, P83
[10]
Least-squares calibration method for fringe projection profilometry with some practical considerations
[J].
OPTIK,
2013, 124 (19)
:4041-4045