Effect of InGaN thickness on assisted trap recombination and behaviour of InGaN/AlGaN double heterostructure LED

被引:1
作者
Rashid, Shanise [1 ]
Wahid, M. Halim A. [1 ]
Ahmad Hambali, N. Azura M. [1 ]
Abdul Halim, N. Syafira [1 ]
Shahimin, Mukhzeer M. [2 ]
机构
[1] Univ Malaysia Perlis, Sch Microelect Engn, SPILS, Pauh Putra Campus, Arau 02600, Perlis, Malaysia
[2] Natl Def Univ Malaysia UPNM, Fac Engn, Dept Elect & Elect Engn, Kuala Lumpur 57000, Malaysia
来源
INTERNATIONAL CONFERENCE ON APPLIED PHOTONICS AND ELECTRONICS 2017 (INCAPE2017) | 2017年 / 162卷
关键词
LIGHT-EMITTING-DIODES; EXTRACTION EFFICIENCY;
D O I
10.1051/epjconf/201716201038
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This work is dedicated to the study of InGaN based LED on the thickness variation effect. The operating voltage, total emission rate, efficiency droop and spontaneous recombination rate was improved by increasing the thickness of InGaN layer of InGaN/AlGaN electron blocking layer (EBL). Based on optical and electrical results, the thicker InGaN layer could have lower operating voltage and higher total emission rate. LED with 5nm thick InGaN layer also could prevent electron leakage into p-region and improve hole injection efficiency. As a result it decreases 60% of efficiency droops and reduces the trap assisted recombination in InGaN/AlGaN active light emitting region. This indicates that InGaN layer may decrease the non-radiative recombination.
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页数:5
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