Thermal degradation of PtMn-pinned top spin valves

被引：1

作者：

Cool, S

Brown, H

Michel, R

机构：

[1] Seagate Recording Heads, Minneapolis, MN 55435 USA

[2] Univ Minnesota, Sch Phys & Astron, Minneapolis, MN 55455 USA

来源：

IEEE TRANSACTIONS ON MAGNETICS | 2000年 / 36卷 / 05期

关键词：

GMR; PtMn; spin valve; thermal degradation;

D O I：

10.1109/20.908639

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The microstructure and magnetic properties of PtMn-pinned top spin valves were studied at various annealing temperatures. Magnetic properties were observed to degrade with increasing temperature, with the exchange coupling H-1 showing the fastest variation. The degradation did not appear to coincide with structural changes or large-scale diffusion, It will be shown that the results are consistent with the grain boundary diffusion degradation mechanism.

引用

页码：2954 / 2956

页数：3

共 4 条

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