A molecular dynamics study of the thermal transport in silicon/germanium nanostructures: From cross-plane to in-plane

被引:14
作者
Wang, Zuyuan [1 ]
机构
[1] Max Planck Inst Polymer Res, Ackermannweg 10, D-55128 Mainz, Germany
关键词
Thermal transport; Molecular dynamics; Interface; Semiconductor; SILICON; CONDUCTIVITY; GERMANIUM;
D O I
10.1016/j.mtcomm.2019.100822
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Thermal transport in silicon/germanium (Si/Ge) nanostructures has been widely studied in both the cross-plane and in-plane configurations. It remains unknown, however, how heat transports in the intermediate configurations. Here we conduct nonequilibrium molecular dynamics simulations to study the thermal conductance of Si/Ge nanostructures that gradually change from a cross-plane to an in-plane configuration. The thermal conductances of the cross-plane and in-plane Si/Ge nanostructures are found to be (1.57 +/- 0.01) x10(8) and (1.60 +/- 0.02) x 10(8) W/m(2)-K respectively at 300 K, both smaller than those of the intermediate nanostructures at the same temperature. As temperature increases, the thermal conductances of the nanostructures decrease, with those of the intermediate nanostructures exhibiting a stronger temperature dependence. The thermal conductances are inconsistent with the trend of the overlap of the vibrational density of states (VDOS) but agree well with the trend of the integrated VDOS in the middle region of the nanostructures.
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页数:5
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