Computed tomography for dimensional metrology

被引：474

作者：

Kruth, J. P. ^{[1
]}

Bartscher, M. ^{[2
]}

Carmignato, S. ^{[3
]}

Schmitt, R. ^{[4
]}

De Chiffre, L. ^{[5
]}

Weckenmann, A. ^{[6
]}

机构：

[1] Katholieke Univ Leuven, Dept Mech Engn, Div PMA, Louvain, Belgium

[2] PTB, Braunschweig, Germany

[3] Univ Padua, DTG, Dept Management & Engn, I-35100 Padua, Italy

[4] Rhein Westfal TH Aachen, WZL, Chair Metrol & Qual Management, Aachen, Germany

[5] Tech Univ Denmark, Dept Mech Engn, Lyngby, Denmark

[6] Univ Erlangen Nurnberg, Chair Qual Management & Mfg Metrol QFM, D-8520 Erlangen, Germany

来源：

CIRP ANNALS-MANUFACTURING TECHNOLOGY | 2011年 / 60卷 / 02期

关键词：

Quality control; Metrology; X-ray computed tomography (CT); MONTE-CARLO;

D O I：

10.1016/j.cirp.2011.05.006

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The paper gives a survey of the upcoming use of X-ray computed tomography (CT) for dimensional quality control purposes: i.e. for traceable measurement of dimensions of technical (mechanical) components and for tolerance verification of such components. It describes the basic principles of CT metrology, putting emphasis on issues as accuracy, traceability to the unit of length (the meter) and measurement uncertainty. It provides a state of the art (anno 2011) and application examples, showing the aptitude of CT metrology to: (i) check internal dimensions that cannot be measured using traditional coordinate measuring machines and (ii) combine dimensional quality control with material quality control in one single quality inspection run. (C) 2011 CIRP.

引用

页码：821 / 842

页数：22

共 98 条

[21] Development and validation of a continuous production concept for thermoplastic honeycomb [J].

Bratfisch, J. Philipp ;

Vandepitte, Dirk .

JOURNAL OF SANDWICH STRUCTURES & MATERIALS, 2007, 9 (02) :113-122

[22] Traceable volume measurements using coordinate measuring systems [J].

Carmignato, S. ;

Savio, E. .

CIRP ANNALS-MANUFACTURING TECHNOLOGY, 2011, 60 (01) :519-522

[23]

Carmignato Simone, 2011, International Journal of Precision Technology, V2, P153, DOI 10.1504/IJPTECH.2011.039457

[24] Testing of x-ray microtomography systems using a traceable geometrical standard [J].

Carmignato, S. ;

Dreossi, D. ;

Mancini, L. ;

Marinello, F. ;

Tromba, G. ;

Savio, E. .

MEASUREMENT SCIENCE AND TECHNOLOGY, 2009, 20 (08)

[25]

Carmignato S, 2010, IND COMP TAG

[26]

Carmignato S, 2007, P 8 ALTEM C MONT IT

[27]

Carmignato S., 2004, IMEKO Int. Symp. Mediterr. Conf. Meas, P387

[28]

Carmignato S, 2010, C APPL CT SCANN IND

[29] Detailed tabulation of atomic form factors, photoelectric absorption and scattering cross section, and mass attenuation coefficients in the vicinity of absorption edges in the soft X-ray (Z=30-36, Z=60-89, E=0.1 keV-10 keV), addressing convergence issues of earlier work [J].

Chantler, CT .

JOURNAL OF PHYSICAL AND CHEMICAL REFERENCE DATA, 2000, 29 (04) :597-1048

[30]

Christoph R, 2007, P 12 INT C SURF, P346

← 1 2 3 4 5 6 7 8 9 10 →