The width of the water/2-heptanone liquid-liquid interface

被引：24

作者：

Luo, GM

Malkova, S

Pingali, SV

Schultz, DG

Lin, BH

Meron, M

Graber, TJ

Gebhardt, J

Vanysek, P ^{[1
]}

Schlossman, ML

机构：

[1] Univ Illinois, Dept Phys, Chicago, IL 60607 USA

[2] Univ Chicago, Ctr Adv Radiat Sources, Chicago, IL 60637 USA

[3] No Illinois Univ, Dept Chem & Biochem, De Kalb, IL 60115 USA

[4] Univ Illinois, Dept Chem, Chicago, IL 60607 USA

来源：

ELECTROCHEMISTRY COMMUNICATIONS | 2005年 / 7卷 / 06期

关键词：

liquid-liquid; interface; width; X-ray reflectivity;

D O I：

10.1016/j.elecom.2005.04.012

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

Synchrotron X-ray reflectivity is used to study the electron density as a function of depth through the bulk water/2-heptanone interface. The measured interfacial width of 7.0 +/- 0.2 angstrom is comparable to the value calculated from capillary wave theory (7.3 angstrom) using the measured interfacial tension of 12.6 mN/m. This result is consistent with capillary wave theory and molecular dynamics simulations that describe a molecularly sharp interface roughened by thermal fluctuations. (c) 2005 Elsevier B.V. All rights reserved.

引用

页码：627 / 630

页数：4