The width of the water/2-heptanone liquid-liquid interface

被引：24
作者：
Luo, GM
Malkova, S
Pingali, SV
Schultz, DG
Lin, BH
Meron, M
Graber, TJ
Gebhardt, J
Vanysek, P [1 ]
Schlossman, ML
机构：
[1] Univ Illinois, Dept Phys, Chicago, IL 60607 USA
[2] Univ Chicago, Ctr Adv Radiat Sources, Chicago, IL 60637 USA
[3] No Illinois Univ, Dept Chem & Biochem, De Kalb, IL 60115 USA
[4] Univ Illinois, Dept Chem, Chicago, IL 60607 USA
来源：
ELECTROCHEMISTRY COMMUNICATIONS | 2005年 / 7卷 / 06期
关键词：
liquid-liquid; interface; width; X-ray reflectivity;
D O I：
10.1016/j.elecom.2005.04.012
中图分类号：
O646 [电化学、电解、磁化学];
学科分类号：
081704 ;
摘要：
Synchrotron X-ray reflectivity is used to study the electron density as a function of depth through the bulk water/2-heptanone interface. The measured interfacial width of 7.0 +/- 0.2 angstrom is comparable to the value calculated from capillary wave theory (7.3 angstrom) using the measured interfacial tension of 12.6 mN/m. This result is consistent with capillary wave theory and molecular dynamics simulations that describe a molecularly sharp interface roughened by thermal fluctuations. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码：627 / 630
页数：4
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