Enhancement of Raman scattering by individual dielectric microspheres

被引：39

作者：

Du, C. L. ^{[1
]}

Kasim, J. ^{[2
]}

You, Y. M. ^{[2
]}

Shi, D. N. ^{[1
]}

Shen, Z. X. ^{[2
]}

机构：

[1] Nanjing Univ Aeronaut & Astronaut, Coll Sci, Nanjing 211100, Peoples R China

[2] Nanyang Technol Univ, Sch Phys & Math Sci, Div Phys & Appl Phys, Singapore 637616, Singapore

来源：

JOURNAL OF RAMAN SPECTROSCOPY | 2011年 / 42卷 / 02期

基金：

中国国家自然科学基金;

关键词：

enhanced Raman scattering; individual polystyrene microspheres; beam diameter; enhancement factor; normalized enhancement factor; POLYSTYRENE MICROSPHERES; PHOTONIC NANOJETS; BACKSCATTERING; NANOPARTICLES; SURFACE; JET;

D O I：

10.1002/jrs.2684

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

Enhanced Raman scattering (ERS) from bulk Si and surface brilliant cresyl blue (Bcb) molecules was investigated by individual polystyrene (PS) microspheres placed on top of the samples. It is revealed that the Raman signal depends both on the microsphere size and the numerical aperture (NA) of the collection lens, and a maximum signal enhancement of similar to 11- and 40-fold for Si and Bcb is observed, respectively, showing strong ERS effect. The different ERS behavior was elucidated by electromagnetic simulations using the finite element method. The present work also provides information on individual dielectric sphere for applications in microscopy, spectroscopic imaging and improvement, etc. Copyright (C) 2010 John Wiley & Sons, Ltd.

引用

页码：145 / 148

页数：4

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