Deep dry etching of borosilicate glass using fluorine-based high-density plasmas for micrbelectromechanical system fabrication

被引:50
作者
Ichiki, T
Sugiyama, Y
Ujiie, T
Horiike, Y
机构
[1] Toyo Univ, Dept Elect & Elect Engn, Kawagoe, Saitama, Japan
[2] Japan Sci & Technol Agcy, PRESTO, Kawaguchi 3320012, Japan
[3] Univ Tokyo, Sch Engn, Dept Mat Sci, Bunkyo Ku, Tokyo 1138656, Japan
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2003年 / 21卷 / 05期
关键词
D O I
10.1116/1.1612935
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
For the fabrication of microelectromechanical. system devices, deep trench etching of borosilicate glass (Coming 7740) has been investigated using SF6/Ar inductively coupled plasma. Since borosilicate glass contains metal elements which produce nonvolatile fluorides, dry etching of its smooth surface is a difficult issue. In this article, requisite conditions for etching glass with a smooth surface and high mask selectivity have been discussed on the basis of the results of a comprehensive experimental study of the effects of substrate bias power and Ar addition on the removal of involatile fluoride residues deposited via the backscattering of etch products in the vicinity of the substrate surface. Under optimized etching conditions, deep trench etching of borosilicate glass to 32 mum depth and 15 mum width has been accomplished using 3-mum-thick chrome metal masks. (C) 2003 American Vacuum Society.
引用
收藏
页码:2188 / 2192
页数:5
相关论文
共 8 条
[1]   Deep anisotropic etching of silicon [J].
Aachboun, S ;
Ranson, P .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1999, 17 (04) :2270-2273
[2]   Characterization of a time multiplexed inductively coupled plasma etcher [J].
Ayón, AA ;
Braff, R ;
Lin, CC ;
Sawin, HH ;
Schmidt, MA .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1999, 146 (01) :339-349
[3]   Surface micromachining for microelectromechanical systems [J].
Bustillo, JM ;
Howe, RT ;
Muller, RS .
PROCEEDINGS OF THE IEEE, 1998, 86 (08) :1552-1574
[4]   Bulk micromachining of silicon [J].
Kovacs, GTA ;
Maluf, NI ;
Petersen, KE .
PROCEEDINGS OF THE IEEE, 1998, 86 (08) :1536-1551
[5]  
Li X., 2000, Proceedings IEEE Thirteenth Annual International Conference on Micro Electro Mechanical Systems (Cat. No.00CH36308), P271, DOI 10.1109/MEMSYS.2000.838528
[6]  
SUGIYAMA Y, P PLASM SCI S 2001 1, P459
[7]   Fabrication of quartz microcapillary electrophoresis chips using plasma etching [J].
Ujiie, T ;
Kikuchi, T ;
Ichiki, T ;
Horiike, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (6A) :3677-3682
[8]   FIELD ASSISTED GLASS-METAL SEALING [J].
WALLIS, G ;
POMERANT.DI .
JOURNAL OF APPLIED PHYSICS, 1969, 40 (10) :3946-&