共 11 条
Fabrication of three dimensional structures for an UV curable nanoimprint lithography mold using variable dose control with critical-energy electron beam exposure
被引:14
作者:
Mohamed, K.
[1
]
Alkaisi, M. M.
[1
]
Blaikie, R. J.
[1
]
机构:
[1] Univ Canterbury, MacDiarmid Inst Adv Mat & Nanotechnol, Christchurch 8020, New Zealand
来源:
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
|
2007年
/
25卷
/
06期
关键词:
D O I:
10.1116/1.2794317
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
In three dimensional (3D) printing the most challenging aspect is in the mold making process. The authors have developed a process for making 3D structures in a simple two-step process. The 3D profiles are created on a negative tone photoresist using electron beam lithography with variable dose and critical-energy electron beam exposure. Resist contrast profiles have been obtained with a negative tone photoresist from Microresist (ma-N2403) and subsequently have been utilized as the 3D masking layer. The 3D patterns have been transferred into a quartz mold by single-step reactive ion etching (RIE) with suitable resist-to-substrate selectivity. The precision of the fabricated structures is important, especially for micro-optic devices. Surface roughness below 2 nm has been achieved when the RIE process pressure is lower than 6 mTorr. The differences between intended and final dimensions are also analyzed. By employing this technique, complex structures for 3D quartz molds can be fabricated with simplified steps. (c) 2007 American Vacuum Society.
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页码:2357 / 2360
页数:4
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