Measurement of the Optical Constants of Thin Metal Films by THz Differential Time Domain Spectroscopy

被引：8

作者：

Ma Feng-Ying ^{[1
]}

Su Jian-Po ^{[1
]}

Gong Qiao-Xia ^{[1
]}

Yang Jing ^{[1
]}

Du Yan-Li ^{[1
]}

Guo Mao-Tian ^{[1
]}

Yuan Bin ^{[1
]}

机构：

[1] Zhengzhou Univ, Sch Phys Sci & Engn, Zhengzhou 450001, Peoples R China

来源：

CHINESE PHYSICS LETTERS | 2011年 / 28卷 / 09期

基金：

中国国家自然科学基金;

关键词：

D O I：

10.1088/0256-307X/28/9/097803

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Three kinds of nanometer-scale metal films (Cr, Ni and Ti) with different thicknesses are fabricated. The complex refractive indices of the three metal films are quantitatively measured by using THz differential time-domain spectroscopy (THz-DTDS). The orders of the complex refractive indices of the thin metal films are equal to those of the reported values. Our results validated that THz-DTDS can be used to study the features of the ultra-thin metal films.

引用

页数：4

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