Optimized Method for Achieving Accurate Signals for "True-Mode" S-Parameter Measurements

被引：0

作者：

Schramm, Marcus ^{[1
]}

Hrobak, Michael ^{[2
]}

Schuer, Jan ^{[3
]}

Schmidt, Lorenz-Peter ^{[3
]}

Konrad, Michael ^{[1
]}

机构：

[1] Konrad Technol, Fritz Reichle Ring 12, D-78315 Radolfzell am Bodensee, Germany

[2] Ferdinand Braun Inst FBH, Leibniz Inst Hoechstfrequenztech, Berlin, Germany

[3] Univ Erlangen Nurnberg, Inst Microwaves & Photon LHFT, D-91058 Erlangen, Germany

来源：

2015 45TH EUROPEAN MICROWAVE CONFERENCE (EUMC) | 2015年

关键词：

vector network analyzer; true-mode S-Parameter; ON-WAFER MEASUREMENTS; NETWORK ANALYZER; CALIBRATION;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Due to the capabilities of modern vector network analyzers (VNAs), the usage of "True-Mode"-signals for characterizing and testing active differential devices is quite convenient. Nevertheless in cases, in which the device under test (DUT) and/or the measurement setup introduces a coupling between the required stimulus signals, current methods require some iteration time to achieve the desired phase and amplitude settings. In this paper a new approach will be introduced, which leads to an optimized testing time which can be crucial especially in industrial production test.

引用

页码：734 / 737

页数：4

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