A metrological reference UV sensor

被引：2

作者：

Bobrenko, Yu. N. ^{[1
]}

Pavelets, S. Yu. ^{[1
]}

Pavelets, A. M. ^{[1
]}

机构：

[1] Natl Acad Sci Ukraine, Lashkar Inst Semicond Phys, UA-03028 Kiev, Ukraine

来源：

INSTRUMENTS AND EXPERIMENTAL TECHNIQUES | 2007年 / 50卷 / 06期

关键词：

D O I：

10.1134/S0020441207060176

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Metrological sensors based on Cu1.8S-A(2)B(6) (A(2)B(6) denote CdSe, CdS, and ZnS semiconductor compounds) photoelectric converters with a high sensitivity to short-wave radiation are described. Photoelectric converters of this type are distinguished by stable properties and a high absolute sensitivity in the UV region. For example, for incident radiation with wavelength lambda = 254 nm, the photocurrent is 70-110 mA/W. Photoelectric converters of the Cu1.8S-CdS type are most sensitive in the short-wave region, while Cu1.8S-CdSe converters can also be used as metrological sensors for visible radiation. By improving the surface-barrier structures, it is possible to produce a photoelectric converter with an area of 100cm(2), a differential resistance of >= 10(8) Omega, and an < 1% nonuniformity of the photocurrent induced by scanning the surface with a light probe.

引用

页码：818 / 820

页数：3

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