A study of the optical and electrical activity of defects at the surface of InGaAs/GaAs multiple quantum well pin photodiodes was done on two different misoriented (111)B GaAs substrates: substrate A, misoriented 1 degrees towards [(2) over bar 11] and substrate B, misoriented 2 degrees towards [<2(11)over bar>]. In this article, we report the existence of different faceted defects at the surface with the misorientation and their influence on the optical performance. The surface of photodiodes grown on substrate A shows inclined pyramids with two enhanced facets. The electron beam induced current measurements showed that these pyramids act as high efficient collector of the e-beam excited electron-hole pairs (e-h). This behaviour agrees with the reduction of the cathodoluminescence emission efficiency at the facets. In contrast, a different pyramid type with one enhanced facet is observed at the surface of diodes grown on substrate B. However, these facets have not shown either optic or electric activity. In these diodes, the dislocations localised at the active region degrade the device performance acting as non-radiative recombination centres. (C) 1999 Elsevier Science Ltd. All rights reserved.
机构:EPSRC Central Facility for III-V Semiconductors, Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield, S1 3JD, Mappin Street
Hopkinson, M
David, JPR
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机构:EPSRC Central Facility for III-V Semiconductors, Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield, S1 3JD, Mappin Street
David, JPR
Khoo, EA
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机构:EPSRC Central Facility for III-V Semiconductors, Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield, S1 3JD, Mappin Street
Khoo, EA
Pabla, AS
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机构:EPSRC Central Facility for III-V Semiconductors, Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield, S1 3JD, Mappin Street
Pabla, AS
Woodhead, J
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机构:EPSRC Central Facility for III-V Semiconductors, Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield, S1 3JD, Mappin Street
Woodhead, J
Rees, GJ
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机构:EPSRC Central Facility for III-V Semiconductors, Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield, S1 3JD, Mappin Street
机构:EPSRC Central Facility for III-V Semiconductors, Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield, S1 3JD, Mappin Street
Hopkinson, M
David, JPR
论文数: 0引用数: 0
h-index: 0
机构:EPSRC Central Facility for III-V Semiconductors, Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield, S1 3JD, Mappin Street
David, JPR
Khoo, EA
论文数: 0引用数: 0
h-index: 0
机构:EPSRC Central Facility for III-V Semiconductors, Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield, S1 3JD, Mappin Street
Khoo, EA
Pabla, AS
论文数: 0引用数: 0
h-index: 0
机构:EPSRC Central Facility for III-V Semiconductors, Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield, S1 3JD, Mappin Street
Pabla, AS
Woodhead, J
论文数: 0引用数: 0
h-index: 0
机构:EPSRC Central Facility for III-V Semiconductors, Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield, S1 3JD, Mappin Street
Woodhead, J
Rees, GJ
论文数: 0引用数: 0
h-index: 0
机构:EPSRC Central Facility for III-V Semiconductors, Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield, S1 3JD, Mappin Street