Development of scattering near-field optical microspectroscopy apparatus using an infrared synchrotron radiation source

被引：20

作者：

Ikemoto, Yuka ^{[1
]}

Ishikawa, Michio ^{[2
]}

Nakashima, Satoru ^{[2
]}

Okamura, Hidekazu ^{[3
]}

Haruyama, Yuichi ^{[4
]}

Matsui, Shinji ^{[4
]}

Moriwaki, Taro ^{[1
]}

Kinoshita, Toyohiko ^{[1
]}

机构：

[1] JASRI Japan Synchrotron Radiat Res Inst SPring8, Kobe, Hyogo 6795198, Japan

[2] Osaka Univ, Grad Sch Sci, Dept Earth & Space Sci, Toyonaka, Osaka 5600043, Japan

[3] Kobe Univ, Grad Sch Sci, Dept Phys, Kobe, Hyogo 6578501, Japan

[4] Univ Hyogo, Lab Adv Sci & Technol Ind, Kamigori, Hyogo 6781205, Japan

来源：

OPTICS COMMUNICATIONS | 2012年 / 285卷 / 08期

关键词：

Near-field microscopy; Infrared spectroscopy; Infrared synchrotron radiation; CONTRAST; SIGNALS;

D O I：

10.1016/j.optcom.2011.12.106

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We report the status of a scattering near-field microspectroscopy apparatus developed at SPring-8 using an infrared synchrotron radiation (IR-SR) source. It consists of a scattering type scanning near-field optical microscope and a Fourier transform infrared spectrometer. The IR-SR is used as a highly brilliant and broadband IR source. This apparatus has potential for application in near-field spectroscopy with high spatial resolution beyond the diffraction limit. In order to eliminate background scatterings from the probe shaft and/or sample surface, we used higher harmonic demodulation method. The near-field spectra were observed by 2nd harmonic components using the lock-in detection. The spatial resolution of about 300 nm was achieved at around 1000 cm(-1) (10 mu m wavelength). (C) 2012 Elsevier B.V. All rights reserved.

引用

页码：2212 / 2217

页数：6

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