The method of determining the characteristic features of graphene oxides by Atomic Force Microscopy

被引:0
作者
Drewniak, S. [1 ]
Muzyka, R. [2 ]
机构
[1] Silesian Tech Univ, Dept Optoelect, 2 Akad St, PL-44100 Gliwice, Poland
[2] Inst Chem Proc Coal, 1 Zamkowa St, PL-41803 Zabrze, Poland
来源
13TH CONFERENCE ON INTEGRATED OPTICS: SENSORS, SENSING STRUCTURES, AND METHODS | 2018年 / 10830卷
关键词
Atomic Force Microscopy; Reduced graphene oxide; graphite; method of oxidation;
D O I
10.1117/12.2503825
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
In this paper, we present the results of the measurements obtained using atomic force microscopy (AFM). The subject of research were the reduced graphene oxides which were obtained by oxidation (in first step) of the graphites and thermally reduction (in the second step). The three types of graphites (flake, scale and synthetic) and three different method of oxidation were used in the measurements. The special attention was paid to the height and horizontal sizes of the obtained material. The results was analysed and relevant conclusions were drawn from them.
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页数:7
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