Ultrasonic sensor system for CaF2 interface monitoring with rods permanently embedded in crystal

被引：0

作者：

Royer, RL ^{[1
]}

Rose, JL ^{[1
]}

机构：

[1] Penn State Univ, Dept Engn Sci & Mech, University Pk, PA 16802 USA

来源：

CRYSTAL RESEARCH AND TECHNOLOGY | 2005年 / 40卷 / 08期

关键词：

ultrasonics; crystal growth; time of flight (TOF); calcium fluoride;

D O I：

10.1002/crat.200410426

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

The interface position of a CaF2 crystal was successfully monitored during growth using an innovative ultrasonic sensor system. The sensor system utilizes a top entry approach consisting of probe rods permanently positioned at the bottom of the crucible. Ultrasonic time of flight data (TOF) is used to determine interface position. (c) 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

引用

页码：761 / 764

页数：4