Two-sided empirical Bayes test for truncation parameter using NA samples

被引：1
|
作者：
Shi, YM [1 ]
Shi, XL
Yan, J
机构：
[1] Northwestern Polytech Univ, Dept Appl Math, Xian 710072, Peoples R China
[2] Northwestern Polytech Univ, Dept Elect Engn, Xian 710072, Peoples R China
[3] NW Univ Xian, Coll Publ Adm, Xian 710069, Peoples R China
来源：
INFORMATION SCIENCES | 2005年 / 173卷 / 1-3期
关键词：
the truncated distribution family; empirical Bayes test; negatively associated samples; asymptotic optimality; convergence rate;
D O I：
10.1016/j.ins.2004.06.007
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
In this study, we develop a two-sided empirical Bayes test (EBT) for the parameter of the truncated distribution family in the case of negatively associated (NA) samples. Given some conditions, the asymptotic optimality and convergence rate are presented. Furthermore we elaborate on the meaning of the results and provide with their interpretation. (c) 2004 Elsevier Inc. All rights reserved.
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页码：65 / 74
页数：10
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