Development of no-flow underfill for lead-free bumped flip-chip assemblies

被引:0
|
作者
Zhang, ZQ [1 ]
Wong, CP [1 ]
机构
[1] Georgia Inst Technol, Sch Mat Sci & Engn, Atlanta, GA 30332 USA
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
No-flow underfill process in flip-chip assembly has become a promising technology towards a smaller, faster and more cost-efficient packaging technology. The current available no-flow underfill materials are mainly designed for eutectic Sn-Pb solders. This paper presents a new no-flow underfill for lead-free solder bumped flip-chip assemblies. Many epoxy resin/HMPA/metal acetylacetonate material systems have been screened in terms of their curing kinetics. Some potential base formulations with curing peak temperatures higher than 200 degreesC are selected for further study. The proper fluxing agents are developed and the effects of fluxing agents on the curing kinetics and cured material properties of the potential base formulations are studied using differential scanning calorimetry (DSC), thermo-mechanical analyzer (TMA), dynamic-mechanical analyzer (DMA), thermogravimetric analyzer (TGA), and rheometer. The results show that the addition of flux significantly reduced the curing temperature and limits the potential of many formulations for application in lead-free bumped flip chip assembles. Fluxing capability of several no-flow formulations is evaluated using the wetting test of lead-free solder balls on a copper board. The feasibility of developed no-flow underfill is demonstrated using a lead-free bumped flip-chip package, which shows 100% yield in interconnection after the solder reflow.
引用
收藏
页码:234 / 240
页数:7
相关论文
共 50 条
  • [21] Stresses and fracture at the chip/underfill interface in flip-chip assemblies
    Park, JE
    Jasiuk, I
    Zubelewicz, A
    JOURNAL OF ELECTRONIC PACKAGING, 2003, 125 (01) : 44 - 52
  • [22] Development of no-flow underfill materials and processes for Pb-free flip chip applications
    Prabhakumar, A
    Buckley, D
    Gillespie, P
    Mandke, S
    Mills, R
    Rubinsztajn, S
    Susarla, P
    Tonapi, S
    PROCEEDINGS OF THE 7TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, VOLS. 1 AND 2, 2005, : 353 - 358
  • [23] Lead-free compatible underfill materials for flip chip applications
    Chee, CK
    Chin, YT
    Sterrett, T
    He, Y
    Sow, HP
    Manepali, R
    Chandran, D
    52ND ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, 2002 PROCEEDINGS, 2002, : 417 - 424
  • [24] The effect of underfill epoxy on warpage in flip-chip assemblies
    Zhang, WG
    Wu, D
    Su, BZ
    Hareb, SA
    Lee, YC
    Masterson, BP
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART A, 1998, 21 (02): : 323 - 329
  • [25] Study of the fluxing agent effects on the properties of no-flow underfill materials for flip-chip applications
    Shi, SH
    Wong, CP
    48TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE - 1998 PROCEEDINGS, 1998, : 117 - 124
  • [26] Study of the fluxing agent effects on the properties of no-flow underfill materials for flip-chip applications
    Shi, SH
    Wong, CP
    IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 1999, 22 (02): : 141 - 151
  • [27] Theoretical Modeling and Prediction of Delamination in Flip Chip Assemblies With Nanofilled No-Flow Underfill Materials
    Mahalingam, Saketh
    Prabhakumar, Ananth
    Tonapi, Sandeep
    Sitaraman, Suresh K.
    JOURNAL OF ELECTRONIC PACKAGING, 2008, 130 (04)
  • [28] Development of a novel filled no-flow underfill material for flip chip applications
    Prabhakumar, A
    Rubinsztajn, S
    Buckley, D
    Campbell, J
    Sherman, D
    Esler, D
    Fiveland, E
    Chaudhuri, A
    Tonapi, S
    PROCEEDINGS OF 5TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2003, : 429 - 434
  • [29] Lead-free bump interconnections for flip-chip applications
    Karim, ZS
    Schetty, R
    TWENTY SIXTH IEEE/CPMT INTERNATIONAL ELECTRONICS MANUFACTURING TECHNOLOGY SYMPOSIUM, PROCEEDINGS, 2000, : 274 - 278
  • [30] Cu pillar bumps as a lead-free drop-in replacement for solder-bumped, flip-chip interconnects
    Ebersberger, Bernd
    Lee, Charles
    58TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, PROCEEDINGS, 2008, : 59 - +