High pressure X-ray emission spectroscopy at the advanced photon source

被引:8
|
作者
Xiao, Yuming [1 ]
Chow, Paul [1 ]
Shen, Guoyin [1 ]
机构
[1] Carnegie Inst Sci, HPCAT, Argonne, IL 60439 USA
关键词
High pressure; X-ray emission spectroscopy; synchrotron radiation; LOW-SPIN TRANSITION; ELECTRONIC-STRUCTURE; VALENCE; SPECTROMETER; CRYSTAL; SCATTERING; TEMPERATURE; BEAMLINE; IRON;
D O I
10.1080/08957959.2016.1209498
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The structural, electronic, and magnetic properties of materials under high pressure are of fundamental interest in physics, chemistry, materials science, and earth sciences. Among several hard X-ray-based techniques, X-ray emission spectroscopy (XES) provides a powerful tool to probe element-specific information for understanding the electronic and magnetic properties of materials under high pressure. Here, we discuss on the particular requirements and instrumentation used in high pressure XES experiments. We then present several examples to illustrate the recent progress in high pressure XES studies at the Advanced Photon Source, followed by an outlook toward future development in high pressure XES.
引用
收藏
页码:315 / 331
页数:17
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