X-ray reflectivity study of thin organic films

被引：0
|
作者：
Basu, JK [1 ]
Sanyal, MK [1 ]
Datta, A [1 ]
机构：
[1] Saha Inst Nucl Phys, Calcutta 700064, W Bengal, India
来源：
RADIATION PHYSICS AND CHEMISTRY | 1998年 / 51卷 / 4-6期
关键词：
D O I：
10.1016/S0969-806X(97)00200-4
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：541 / 542
页数：2
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