Synchrotron X-ray measurement of residual strain within the nose of a worn manganese steel railway crossing

被引:7
|
作者
Dhar, S. [1 ]
Zhang, Y. [1 ]
Xu, R. [2 ]
Danielsen, H. K. [1 ]
Jensen, D. Juul [1 ]
机构
[1] Tech Univ Denmark, Sect Mat Sci & Adv Characterizat, Dept Wind Energy, Riso Campus, DK-4000 Roskilde, Denmark
[2] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA
来源
38TH RISO INTERNATIONAL SYMPOSIUM ON MATERIALS SCIENCE | 2017年 / 219卷
关键词
STRESS; DAMAGE;
D O I
10.1088/1757-899X/219/1/012016
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Switches and crossings are an integral part of any railway network. Plastic deformation associated with wear and rolling contact fatigue due to repeated passage of trains cause severe damage leading to the formation of surface and sub-surface cracks which ultimately may result in rail failure. Knowledge of the internal stress distribution adds to the understanding of crack propagation and may thus help to prevent catastrophic rail failures. In this work, the residual strains inside the bulk of a damaged nose of a manganese railway crossing that was in service for five years has been investigated by using differential aperture synchrotron X-ray diffraction. The main purpose of this paper is to describe how this method allows non-destructive measurement of residual strains in selected local volumes in the bulk of the rail. Measurements were conducted on the transverse surface at a position about 6.5 mm from the rail running surface of a crossing nose. The results revealed the presence of significant compressive residual strains along the running direction of the rail.
引用
收藏
页数:6
相关论文
共 33 条
  • [1] Crack formation within a Hadfield manganese steel crossing nose
    Dhar, Somrita
    Danielsen, Hilmar K.
    Faester, Soren
    Rasmussen, Carsten
    Zhang, Yubin
    Jensen, Dorte Juul
    WEAR, 2019, 438
  • [2] Residual strain orientation in rolled titanium determined with synchrotron X-ray Laue microdiffraction
    Devoe, Michelle
    Tamura, Nobumichi
    Wenk, Hans-Rudolf
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2023, 56 : 135 - 142
  • [3] In Situ Synchrotron X-ray Diffraction Measurement of the Strain Distribution in Si Die for the Embedded Substrates
    Hsu, Hsueh Hsien
    Chen, Hao
    Ouyang, Yao Tsung
    Chiu, Tz Cheng
    Chang, Tao Chih
    Lee, Hsin Yi
    Ku, Chin Shun
    Wu, Albert T.
    JOURNAL OF ELECTRONIC MATERIALS, 2015, 44 (10) : 3942 - 3947
  • [4] Microstructure and residual elastic strain at graphite nodules in ductile cast iron analyzed by synchrotron X-ray microdiffraction
    Zhang, Y. B.
    Andriollo, T.
    Faester, S.
    Barabash, R.
    Xu, R.
    Tiedje, N.
    Thorborg, J.
    Hattel, J.
    Jensen, D. Juul
    Hansen, N.
    ACTA MATERIALIA, 2019, 167 : 221 - 230
  • [5] Stress strain tensors with their application to X-ray stress measurement
    Kurita, Masanori
    Zairyo/Journal of the Society of Materials Science, Japan, 2015, 64 (12) : 1003 - 1009
  • [6] Three-dimensional strain mapping using in situ X-ray synchrotron microtomography
    Toda, H.
    Maire, E.
    Aoki, Y.
    Kobayashi, M.
    JOURNAL OF STRAIN ANALYSIS FOR ENGINEERING DESIGN, 2011, 46 (07) : 549 - 561
  • [7] Strain response of thermal barrier coatings captured under extreme engine environments through synchrotron X-ray diffraction
    Knipe, Kevin
    Manero, Albert, II
    Siddiqui, Sanna F.
    Meid, Carla
    Wischek, Janine
    Okasinski, John
    Almer, Jonathan
    Karlsson, Anette M.
    Bartsch, Marion
    Raghavan, Seetha
    NATURE COMMUNICATIONS, 2014, 5
  • [8] Evaluation of Strain Measurement in a Die-to-Interposer Chip Using In Situ Synchrotron X-Ray Diffraction and Finite-Element Analysis
    Hsu, Hsueh-Hsien
    Chiu, Tz-Cheng
    Chang, Tao-Chih
    Huang, Shin-Yi
    Lee, Hsin-Yi
    Ku, Ching-Shun
    Lin, Yang-Yi
    Su, Chien-Hao
    Chou, Li-Wei
    Ouyang, Yao-Tsung
    Huang, Yi-Ting
    Wu, Albert T.
    JOURNAL OF ELECTRONIC MATERIALS, 2014, 43 (01) : 52 - 56
  • [9] Synchrotron X-Ray Topography for Encapsulation Stress/Strain and Crack Detection in Crystalline Silicon Modules
    Colli, Alessandra
    Attenkofer, Klaus
    Raghothamachar, Balaji
    Dudley, Michael
    IEEE JOURNAL OF PHOTOVOLTAICS, 2016, 6 (05): : 1387 - 1389
  • [10] Measurement of applied strains in thin films deposited onto polymer by synchrotron X-ray diffraction
    Renault, P. O.
    Djaziri, S.
    Le Bourhis, E.
    Goudeau, Ph
    Faurie, D.
    Thiaudiere, D.
    Hild, F.
    11TH INTERNATIONAL CONFERENCE ON THE MECHANICAL BEHAVIOR OF MATERIALS (ICM11), 2011, 10