Numerical simulation of microscopic motion and deposition of nanoparticles via electrodynamic focusing

被引:35
作者
You, Sukbeom [1 ]
Choi, Mansoo [1 ]
机构
[1] Seoul Natl Univ, Sch Mech & Aerosp Engn, Inst Adv Machinery & Design, Natl CRI Ctr Nano Particle Control, Seoul 151742, South Korea
关键词
nanoparticle patterning; electrodynamic focusing; charged aerosols;
D O I
10.1016/j.jaerosci.2007.08.002
中图分类号
TQ [化学工业];
学科分类号
0817 ;
摘要
A computational model was developed to simulate microscopic motion and deposition of charged aerosols during the nanoparticle patterning process utilizing electrodynamic focusing concept (Kim et al., 2006). Our computational model includes Brownian random force, Coulomb and image forces, fluid drag and van der Waals force for determining Lagrangian particle trajectories after solving electrostatic fields in the deposition chamber. Our results are in agreement with the previous experimental findings. The effects of operation parameters such as surface charge density, applied voltage and particle charges were investigated. It was found that the electric field-induced motion of particles dominated over Brownian random motion of 10 nm nanoparticles near the surface and the inertial motion of charged nanoparricles under high electric field would be important to determine the precise deposition pattern within submicrometer scale structures. (C) 2007 Elsevier Ltd. All rights reserved.
引用
收藏
页码:1140 / 1149
页数:10
相关论文
共 24 条
[1]   Stochastic problems in physics and astronomy [J].
Chandrasekhar, S .
REVIEWS OF MODERN PHYSICS, 1943, 15 (01) :0001-0089
[2]  
CHOI M, 2005, Patent No. 200530239
[3]  
Collison WZ, 1996, APPL PHYS LETT, V68, P903, DOI 10.1063/1.116225
[4]   Dissipation, fluctuations, and conservation laws [J].
Grassia, P .
AMERICAN JOURNAL OF PHYSICS, 2001, 69 (02) :113-119
[5]   COMPUTER-SIMULATIONS OF BROWNIAN-MOTION OF COMPLEX-SYSTEMS [J].
GRASSIA, PS ;
HINCH, EJ ;
NITSCHE, LC .
JOURNAL OF FLUID MECHANICS, 1995, 282 :373-403
[6]  
HAN B, 2003, Patent No. 200344625
[7]  
Hinds W.C., 1999, Aerosol technology: Properties, behavior, and measurement of airborne particles, V2nd ed., DOI [DOI 10.1016/0021-8502(83)90049-6, 10.1016/0021-8502(83)90049-6]
[8]  
Israelachvili JN, 2011, INTERMOLECULAR AND SURFACE FORCES, 3RD EDITION, P1
[9]   Submicrometer patterning of charge in thin-film electrets [J].
Jacobs, HO ;
Whitesides, GM .
SCIENCE, 2001, 291 (5509) :1763-1766
[10]  
James ML, 1985, APPL NUMERICAL METHO