Thickness dependent microstructural changes in La0.5Ca0.5MnO3 thin films deposited on (111) SrTiO3

被引：2

作者：

Aydogdu, G. H. ^{[1
]}

Kuru, Y. ^{[1
]}

Nelayah, J. ^{[2
]}

van Aken, P. A. ^{[2
]}

Habermeier, H-U. ^{[1
]}

机构：

[1] Max Planck Inst Solid State Res, D-70569 Stuttgart, Germany

[2] Max Planck Inst Met Res, D-70569 Stuttgart, Germany

来源：

THIN SOLID FILMS | 2010年 / 518卷 / 16期

关键词：

LCMO; Thin film; Stress relaxation; X-ray diffraction; HRTEM; INSULATOR-METAL TRANSITION; MAGNETIC-FIELD; EPITAXIAL STRAIN; MAGNETORESISTANCE; RESISTIVITY;

D O I：

10.1016/j.tsf.2009.12.055

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The epitaxial strain can modify the physical properties of complex oxide thin films considerably. The strain effect is expected to be less pronounced for relatively thick films and the physical properties should resemble to the bulk material. However, it has been recently observed that the electronic and magnetic properties of La0.5Ca0.5MnO3 thin films deposited on (111) SrTiO3 substrates thicker than a threshold value differ considerably from the bulk material. This observation is a hint for some interesting microstructural features in these films. In the present study, the microstructure of La0.5Ca0.5MnO3 thin films on (111) SrTiO3 substrates is investigated by X-ray diffraction and high resolution transmission electron microscopy. (C) 2009 Elsevier B.V. All rights reserved.

引用

页码：4667 / 4669

页数：3

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