Thickness and refractive index measurements using multiple beam interference fringes (FECO)

被引:27
作者
Tadmor, R
Chen, NH
Israelachvili, JN [1 ]
机构
[1] Univ Calif Santa Barbara, Mat Res Lab, Santa Barbara, CA 93106 USA
[2] Univ Calif Santa Barbara, Dept Chem Engn, Santa Barbara, CA 93106 USA
基金
美国国家航空航天局;
关键词
large separations; thick films; three-layer interferometer; dispersion; dispersive phase change;
D O I
10.1016/S0021-9797(03)00405-3
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We report on the use of optical interferometry employing fringes of equal chromatic order (FECO) in a surface force apparatus (SFA) to determine film thicknesses and refractive indices of confined media for a wide range of separations. In particular, we show how to calculate the surface separation (film thickness) based on two fringes whose contact position was not measured. We discuss the measurement accuracy, and though the theoretical accuracy is I Angstrom for all separations, we show that in practice, for large separations, it is very hard to get to this accuracy. (C) 2003 Elsevier Inc. All rights reserved.
引用
收藏
页码:548 / 553
页数:6
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