Rescuing RRAM-Based Computing From Static and Dynamic Faults

被引:8
|
作者
Lin, Jilan [1 ]
Wen, Cheng-Da [2 ]
Hu, Xing [1 ]
Tang, Tianqi [1 ]
Lin, Ing-Chao [2 ]
Wang, Yu
Xie, Yuan [1 ]
机构
[1] Univ Calif Santa Barbara, Dept Elect & Comp Engn, Santa Barbara, CA 93106 USA
[2] Natl Cheng Kung Univ, Dept Comp Sci & Informat Engn, Tainan 701, Taiwan
基金
美国国家科学基金会;
关键词
Resistance; Kernel; Fault tolerant systems; Fault tolerance; Reliability; Quantization (signal); Electrodes; Neural network (NN); reliability; resistive random access memory (RRAM); NEURAL-NETWORK; CIRCUIT; ENERGY; RESET;
D O I
10.1109/TCAD.2020.3037316
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Emerging resistive random access memory (RRAM) has shown the great potential of in-memory processing capability, and thus attracts considerable research interests in accelerating memory-intensive applications, such as neural networks (NNs). However, the accuracy of RRAM-based NN computing can degrade significantly, due to the intrinsic statistical variations of the resistance of RRAM cells. In this article, we propose SIGHT, a synergistic algorithm-architecture fault-tolerant framework, to holistically address this issue. Specifically, we consider three major types of faults for RRAM computing: 1) nonlinear resistance distribution; 2) static variation; and 3) dynamic variation. From the algorithm level, we propose a resistance-aware quantization to compel the NN parameters to follow the exact nonlinear resistance distribution as RRAM, and introduce an input regulation technique to compensate for RRAM variations. We also propose a selective weight refreshing scheme to address the dynamic variation issue that occurs at runtime. From the architecture level, we propose a general and low-cost architecture accordingly for supporting our fault-tolerant scheme. Our evaluation demonstrates almost no accuracy loss for our three fault-tolerant algorithms, and the proposed SIGHT architecture incurs performance overhead as little as 7.14%.
引用
收藏
页码:2049 / 2062
页数:14
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