Vision-based automated inspection system in computer integrated manufacturing

被引：6

作者：

Chen, FL

Su, CT

机构：

[1] Department of Industrial Engineering, National Tsing Hua University, Hsinchu

来源：

INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY | 1996年 / 11卷 / 03期

关键词：

automated inspection; computer integrated manufacturing; machine vision; pattern recognition; quality control;

D O I：

10.1007/BF01351326

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

The industrial application of an automated inspection system that aims to enhance the efficiency and flexibility of a computer integrated manufacturing system (CIMS) is proposed in this paper. A machine-vision-based approach is adopted to utilise its advantages of measurement flexibility, high resolution, and non-destruction. With a closed-loop feedback control architecture, the inspection procedures are fully integrated with the production process to detect and to recover abnormal operations in a real-time mode. Implementation of such a system at a physical shop floor for socket inspection is presented as an example.

引用

页码：206 / 213

页数：8