A Simple Method for Obtaining Minimum Aberration Designs

被引:2
作者
Wang, P. C. [1 ]
机构
[1] Chang Gung Univ, Dept Ind & Business Management, Tao Yuan 333, Taiwan
关键词
Fractional factorial; Minimum aberration; Orthogonal array; FRACTIONAL FACTORIAL-DESIGNS; PLANNING EXPERIMENTS; 2-LEVEL;
D O I
10.1080/03610920903259849
中图分类号
O21 [概率论与数理统计]; C8 [统计学];
学科分类号
020208 ; 070103 ; 0714 ;
摘要
Minimum aberration designs are preferred in practice, especially when it is desired to carry out a multi-factor experiment using less number of runs. Several authors considered constructions of minimum aberration designs. Some used computer algorithms and some listed good designs from the exhausted search. We propose a simple method to obtain minimum aberration designs for experiments of size less than or equal to thirty-two. Here, we use an ordered sequence of columns from an orthogonal array to design experiments and blocked experiments. When the method is implemented in MS Excel, minimum aberration designs can be easily achieved.
引用
收藏
页码:3363 / 3370
页数:8
相关论文
共 12 条
[1]  
[Anonymous], 1985, INTRO OFF LINE QUALI
[2]   A CATALOG OF 2-LEVEL AND 3-LEVEL FRACTIONAL FACTORIAL-DESIGNS WITH SMALL RUNS [J].
CHEN, JH ;
SUN, DX ;
WU, CFJ .
INTERNATIONAL STATISTICAL REVIEW, 1993, 61 (01) :131-145
[4]   CONSTRUCTING TABLES OF MINIMUM ABERRATION PN-M DESIGNS [J].
FRANKLIN, MF .
TECHNOMETRICS, 1984, 26 (03) :225-232
[5]   MINIMUM ABERRATION 2K-P DESIGNS [J].
FRIES, A ;
HUNTER, WG .
TECHNOMETRICS, 1980, 22 (04) :601-608
[6]  
KACKER RN, 1990, J QUAL TECHNOL, V22, P1
[7]   Semifolding 2k-p designs [J].
Mee, RW ;
Peralta, M .
TECHNOMETRICS, 2000, 42 (02) :122-134
[8]   Fractional resolution and minimum aberration in blocked 2(n-k) designs [J].
Sitter, RR ;
Chen, JH ;
Feder, M .
TECHNOMETRICS, 1997, 39 (04) :382-390
[9]   Planning experiments when some specified interactions are investigated [J].
Wang, P. C. .
COMPUTATIONAL STATISTICS & DATA ANALYSIS, 2007, 51 (09) :4143-4151
[10]   Strategies for semi-folding fractional factorial designs [J].
Wang, PC ;
Lee, C .
QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL, 2006, 22 (03) :265-273