Quantifying Pathways and Friction of Nanoparticles During Controlled Manipulation by Contact-Mode Atomic Force Microscopy

被引:28
作者
Dietzel, D. [1 ]
Feldmann, M. [1 ]
Herding, C. [1 ]
Schwarz, U. D. [2 ]
Schirmeisen, A. [1 ]
机构
[1] Univ Munster, Physikal Inst, D-48149 Munster, Germany
[2] Yale Univ, Dept Mech Engn, Ctr Res Interface Struct & Phenomena CRISP, New Haven, CT 06520 USA
关键词
Nanotribology; AFM; QUANTITATIVE-ANALYSIS; NANOMETER-SCALE; SOLID MATERIALS; LOW LOADS; DEFORMATIONS; ADHESION; MOTION;
D O I
10.1007/s11249-010-9643-z
中图分类号
TQ [化学工业];
学科分类号
0817 ;
摘要
Measuring interfacial friction during the manipulation of nanoparticles is becoming an increasingly important approach in nanotribology research. In this work, antimony and gold particles deposited on flat graphite surfaces have been translated by the tip of an atomic force microscope in contact mode along defined pathways. Two different manipulation techniques are discussed with respect to pathway control and friction quantification. The first technique includes pushing the particles from the side, which often results in a loss of the particle during translation due to unwanted sidewards motion. We analyze this phenomenon with an analytical model and find good agreement with experiments. An alternative approach is to move the particle while the tip remains on its top. We demonstrate that this approach allows better manipulation pathway control and that simultaneous interfacial friction measurements are in quantitative agreement with the first manipulation method.
引用
收藏
页码:273 / 281
页数:9
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