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Study of the influence of dopants on the crystalline perfection of ferroelectric glycine phosphite single crystals using high-resolution X-ray diffraction analysis
被引:81
作者:
Kumar, Krishnamurthy Senthil
[1
]
Babu, Sridharan Moorthy
[1
]
Bhagavannarayana, G.
[2
]
机构:
[1] Anna Univ, Ctr Crystal Growth, Chennai 600025, Tamil Nadu, India
[2] CSIR, Natl Phys Lab, New Delhi 110012, India
关键词:
crystal growth from solutions;
ferroelectric materials;
high-resolution X-ray diffraction;
POINT-DEFECTS;
ENHANCEMENT;
EFFICIENCY;
LINBO3;
ZTS;
ADP;
D O I:
10.1107/S0021889811005140
中图分类号:
O6 [化学];
学科分类号:
0703 ;
摘要:
Good quality and optically transparent single crystals of pure and doped glycine phosphite (GPI) were grown by both solvent-evaporation and temperature-cooling techniques. Dopants were chosen in different categories, namely transition metals (Cr, Mn, Co, Ni, Zn, Mg, Cd), rare-earth metals (Ce, Nd, La), dyes (rhodamine B, malachite green, fluorescein) and an amino acid (l-proline). The concentration of dopants was chosen depending on the category of dopants and the quality of crystallization during the growth process. The crystalline perfection of the as-grown pure and doped GPI crystals was investigated by high-resolution X-ray diffraction at room temperature. A multicrystal X-ray diffractometer employing a well collimated and highly monochromated Mo K alpha(1) beam and set in the (+, -, -, +) configuration was employed. Most of the crystal specimens show excellent crystalline perfection. However, grain boundaries, low-angle tilt boundaries, and vacancy and interstitial point defects were observed in some crystal specimens.
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页码:313 / 318
页数:6
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