Study of the influence of dopants on the crystalline perfection of ferroelectric glycine phosphite single crystals using high-resolution X-ray diffraction analysis

被引:80
作者
Kumar, Krishnamurthy Senthil [1 ]
Babu, Sridharan Moorthy [1 ]
Bhagavannarayana, G. [2 ]
机构
[1] Anna Univ, Ctr Crystal Growth, Chennai 600025, Tamil Nadu, India
[2] CSIR, Natl Phys Lab, New Delhi 110012, India
关键词
crystal growth from solutions; ferroelectric materials; high-resolution X-ray diffraction; POINT-DEFECTS; ENHANCEMENT; EFFICIENCY; LINBO3; ZTS; ADP;
D O I
10.1107/S0021889811005140
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Good quality and optically transparent single crystals of pure and doped glycine phosphite (GPI) were grown by both solvent-evaporation and temperature-cooling techniques. Dopants were chosen in different categories, namely transition metals (Cr, Mn, Co, Ni, Zn, Mg, Cd), rare-earth metals (Ce, Nd, La), dyes (rhodamine B, malachite green, fluorescein) and an amino acid (l-proline). The concentration of dopants was chosen depending on the category of dopants and the quality of crystallization during the growth process. The crystalline perfection of the as-grown pure and doped GPI crystals was investigated by high-resolution X-ray diffraction at room temperature. A multicrystal X-ray diffractometer employing a well collimated and highly monochromated Mo K alpha(1) beam and set in the (+, -, -, +) configuration was employed. Most of the crystal specimens show excellent crystalline perfection. However, grain boundaries, low-angle tilt boundaries, and vacancy and interstitial point defects were observed in some crystal specimens.
引用
收藏
页码:313 / 318
页数:6
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