Fabrication and Characterization of Superconducting Resonators

被引:1
|
作者
Cataldo, Giuseppe [1 ]
Barrentine, Emily M. [2 ]
Brown, Ari D. [2 ]
Moseley, Samuel H. [1 ]
U-Yen, Kongpop [2 ]
Wollack, Edward J. [1 ]
机构
[1] NASA, Astrophys Sci Div, Goddard Space Flight Ctr, Washington, DC 20546 USA
[2] NASA, Instrument Syst & Technol Div, Goddard Space Flight Ctr, Washington, DC 20546 USA
来源
基金
美国国家航空航天局;
关键词
Engineering; Issue; 111; Superconducting resonators; microwave devices; MKIDs; cryogenic measurements; calibration; complex transmission; micro-fabrication; reactive sputtering; wafer-level bonding; FANO RESONANCE;
D O I
10.3791/53868
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Superconducting microwave resonators are of interest for a wide range of applications, including for their use as microwave kinetic inductance detectors (MKIDs) for the detection of faint astrophysical signatures, as well as for quantum computing applications and materials characterization. In this paper, procedures are presented for the fabrication and characterization of thin-film superconducting microwave resonators. The fabrication methodology allows for the realization of superconducting transmission-line resonators with features on both sides of an atomically smooth single-crystal silicon dielectric. This work describes the procedure for the installation of resonator devices into a cryogenic microwave testbed and for cool-down below the superconducting transition temperature. The set-up of the cryogenic microwave testbed allows one to do careful measurements of the complex microwave transmission of these resonator devices, enabling the extraction of the properties of the superconducting lines and dielectric substrate (e.g., internal quality factors, loss and kinetic inductance fractions), which are important for device design and performance.
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页数:8
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