Sensitive 320 Gbit/s eye diagram measurements via optical sampling with semiconductor optical amplifier-ultrafast nonlinear interferometer

被引：25
作者：
Kang, I [1 ]
Dreyer, KF [1 ]
机构：
[1] Lucent Technol, Bell Labs, Holmdel, NJ 07733 USA
来源：
ELECTRONICS LETTERS | 2003年 / 39卷 / 14期
关键词：
D O I：
10.1049/el:20030681
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
High bit rate (320 Gbit/s) all-optical eye measurements requiring only milliwatt signal power and 25 0 sampling pulse energy are reported. The system is based on a semiconductor optical amplifier interferometer with time-domain filtering of the ASE noise.
引用
收藏
页码：1081 / 1083
页数：3
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