Effect of thermal annealing in the microstructural and the optical properties of uncapped InAs quantum dots grown on GaAs buffer layers

被引:5
作者
Lee, KH
Lee, JY
Lee, DU
Kim, TW
Lee, HS
Kim, MD
机构
[1] Hanyang Univ, Adv Semicond Res Ctr, Div Elect & Comp Engn, Seoul 133791, South Korea
[2] Korea Adv Inst Sci & Technol, Dept Mat Sci & Engn, Taejon 305701, South Korea
[3] Kyungpook Natl Univ, Dept Mat Sci & Met, Taegu 702701, South Korea
[4] Chungnam Natl Univ, Dept Phys, Taejon 305764, South Korea
关键词
nanostructures; crystal growth; transmission electron microscopy; optical properties;
D O I
10.1016/j.ssc.2004.08.010
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The effect of thermal annealing on self-assembled uncapped InAs/GaAs quantum dots (QDs) has been investi2ated using transmission electron microscopy (TEM) and photolurninescence (PL) measurement. The TEM images showed that the lateral sizes and densities of the InAs QDs were not changed significantly up to 6-50degreesC. When the InAs/GaAs QDs were annealed at 700 degreesC, while the lateral size of the InAs QDs increased. their density decreased. The InAs QDs disappeared at 800 degreesC. PL spectra showed that the peaks corresponding to the interband transitions of the InAS QDs shifted slightly toward the high-energy side, and the PL intensity decreased with increasing annealing temperature. These results indicate that the microstructural and the optical properties of self-assembled uncapped InAs/GaAs can he modified due to postgrowth thermal annealing. (C) 2005 Elsevier Ltd. All rights reserved.
引用
收藏
页码:65 / 70
页数:6
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