Improved assertion lifetime via assertion-based testing methodology

被引:0
作者
Riazati, Mohammad [1 ]
Mohammadi, Siamak [1 ]
Afzali-Kusha, Ali [1 ]
Navabi, Zain [1 ]
机构
[1] Univ Tehran, Sch Elect & Comp Engn, Tehran 14174, Iran
来源
2006 INTERNATIONAL CONFERENCE ON MICROELECTRONICS | 2007年
关键词
assertion; OVL; on-line testing; fault coverage;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Assertions-based verification (ABV) has been widely used in digital design validation. Assertions are HDL-syntaxed representation of design specification and used as a functional error detection mechanism. During the process of designing with HDLs, assertions are imported which could fire in case of violation during testbench run. Although these assertions are mostly used during simulation and for verifying the functional correctness of the design, but as they illustrate the specifications of a design, it is likely that their lifetime could be extended by embedding them in the chip to detect low level faults like stuck-at faults. In this paper, we introduce a new automatable assertion-based on-line testing methodology. Experimental results show that the synthesis of assertions into a chip, and then using them for online testing, can provide an acceptable coverage for stuck-at faults.
引用
收藏
页码:48 / +
页数:2
相关论文
共 12 条
[1]  
BERGERON J, WRITING TESTBENCHERS
[2]   Incorporating efficient assertion checkers into hardware emulation [J].
Boulé, M ;
Zilic, Z .
2005 IEEE INTERNATIONAL CONFERENCE ON COMPUTER DESIGN: VLSI IN COMPUTERS & PROCESSORS, PROCEEDINGS, 2005, :221-228
[3]  
CORTEZL J, 2005, 2 INT C EL EL ENG IC
[4]  
GADKARI AA, DES AUT TEST EUR 200, P390
[5]  
HESSABI S, 16 INT C MICR ICM 20, P232
[6]  
Lacey David J, 2004, Assertion-based design
[7]   Enhancing reliability of RTL controller-datapath circuits via invariant-based concurrent test [J].
Makris, Y ;
Bayraktaroglu, I ;
Orailoglu, A .
IEEE TRANSACTIONS ON RELIABILITY, 2004, 53 (02) :269-278
[8]  
NAVABI Z, 2005, VERILOG DIGITAL SYST
[9]  
Venkatasubramanian R, 2003, 9TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM, PROCEEDINGS, P137
[10]  
ZIGV A, 2003, DES AUT TEST EUR C, P834