Ag-coverage-dependent symmetry of the electronic states of the Pt(111)-Ag-Bi interface: The ARPES view of a structural transition

被引：10

作者：

Frantzeskakis, E. ^{[1
]}

Pons, S. ^{[1
,2
]}

Crepaldi, A. ^{[1
]}

Brune, H. ^{[1
]}

Kern, K. ^{[1
,3
]}

Grioni, M. ^{[1
]}

机构：

[1] Ecole Polytech Fed Lausanne, ICMP, Stn 3, CH-1015 Lausanne, Switzerland

[2] Univ Paris 06, Inst NanoSci Paris INSP, CNRS, F-75252 Paris 05, France

[3] Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany

来源：

PHYSICAL REVIEW B | 2011年 / 84卷 / 24期

关键词：

GROWTH; SURFACE; MICROSCOPY; CU(111); AG(111); SCATTERING; SB;

D O I：

10.1103/PhysRevB.84.245443

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We studied by angle-resolved photoelectron spectroscopy the strain-related structural transition from a pseudomorphic monolayer (ML) to a striped incommensurate phase in an Ag thin film grown on Pt(111). We exploited the surfactant properties of Bi to grow ordered Pt(111)-xMLAg-Bi trilayers with 0 <= x <= 5 ML, and monitored the dispersion of the Bi-derived interface states to probe the structure of the underlying Ag film. We find that their symmetry changes from threefold to sixfold and back to threefold in the Ag coverage range studied. Together with previous scanning tunneling microscopy and photoelectron diffraction data, these results provide a consistent microscopic description of the coverage-dependent structural transition.

引用

页数：10

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