Low Voltage High-Energy α-Particle Detectors by GaN-on-GaN Schottky Diodes with Record-High Charge Collection Efficiency

被引:12
作者
Sandupatla, Abhinay [1 ]
Arulkumaran, Subramaniam [2 ,3 ]
Ranjan, Kumud [2 ]
Ng, Geok Ing [1 ,2 ]
Murmu, Peter P. [4 ]
Kennedy, John [4 ]
Nitta, Shugo [3 ]
Honda, Yoshio [3 ]
Deki, Manato [3 ]
Amano, Hiroshi [3 ]
机构
[1] Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore
[2] Temasek Labs NTU, Res Techno Plaza,50 Nanyang Dr, Singapore 639798, Singapore
[3] Nagoya Univ, CIRFE, IMaSS, Nagoya, Aichi 4648603, Japan
[4] GNS Sci, Natl Isotope Ctr, Lower Hutt 5010, New Zealand
关键词
high-energy alpha-particle detection; low voltage; thick depletion width detectors;
D O I
10.3390/s19235107
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
A low voltage (-20 V) operating high-energy (5.48 MeV) alpha-particle detector with a high charge collection efficiency (CCE) of approximately 65% was observed from the compensated (7.7 x 10(14) /cm(3)) metalorganic vapor phase epitaxy (MOVPE) grown 15 mu m thick drift layer gallium nitride (GaN) Schottky diodes on free-standing n+-GaN substrate. The observed CCE was 30% higher than the bulk GaN (400 mu m)-based Schottky barrier diodes (SBD) at -20 V. This is the first report of alpha-particle detection at 5.48 MeV with a high CCE at -20 V operation. In addition, the detectors also exhibited a three-times smaller variation in CCE (0.12 %/V) with a change in bias conditions from -120 V to -20 V. The dramatic reduction in CCE variation with voltage and improved CCE was a result of the reduced charge carrier density (CCD) due to the compensation by Mg in the grown drift layer (DL), which resulted in the increased depletion width (DW) of the fabricated GaN SBDs. The SBDs also reached a CCE of approximately 96.7% at -300 V.
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页数:11
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共 30 条
  • [1] [Anonymous], 2016, THESIS
  • [2] [Anonymous], NUCL INSTRUMENTS MET, DOI DOI 10.1016/j.nimb.2010.02.091
  • [3] The toughest transistor yet
    Eastman, LF
    Mishra, UK
    [J]. IEEE SPECTRUM, 2002, 39 (05) : 28 - +
  • [4] The improvement of ohmic contact of Ti/Al/Ni/Au to AlGaN/GaN HEMT by multi-step annealing method
    Feng, Qian
    Li, Li-Mei
    Hao, Yue
    Ni, Jin-Yu
    Zhang, Jin-Cheng
    [J]. SOLID-STATE ELECTRONICS, 2009, 53 (09) : 955 - 958
  • [5] GaN as a radiation hard particle detector
    Grant, J.
    Bates, R.
    Cunningham, W.
    Blue, A.
    Melone, J.
    McEwan, F.
    Vaitkus, J.
    Gaubas, E.
    O'Shea, V.
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2007, 576 (01) : 60 - 65
  • [6] Near unity ideality factor and Shockley-Read-Hall lifetime in GaN-on-GaN p-n diodes with avalanche breakdown
    Hu, Zongyang
    Nomoto, Kazuki
    Song, Bo
    Zhu, Mingda
    Qi, Meng
    Pan, Ming
    Gao, Xiang
    Protasenko, Vladimir
    Jena, Debdeep
    Xing, Huili Grace
    [J]. APPLIED PHYSICS LETTERS, 2015, 107 (24)
  • [7] Highly transparent light emitting diodes on graphene encapsulated Cu nanowires network
    Huang, Youyang
    Huang, Zongxing
    Zhong, Zhibai
    Yang, Xu
    Hong, Qiming
    Wang, Huachun
    Huang, Shengrong
    Gao, Na
    Chen, Xiaohong
    Cai, Duanjun
    Kang, Junyong
    [J]. SCIENTIFIC REPORTS, 2018, 8
  • [8] Radiation hardness of gallium nitride
    Ionascut-Nedelcescu, A
    Carlone, C
    Houdayer, A
    von Bardeleben, HJ
    Cantin, JL
    Raymond, S
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2002, 49 (06) : 2733 - 2738
  • [9] Electrical properties and radiation detector performance of free-standing bulk n-GaN
    Lee, In-Hwan
    Polyakov, A. Y.
    Smirnov, N. B.
    Govorkov, A. V.
    Kozhukhova, E. A.
    Zaletin, V. M.
    Gazizov, I. M.
    Kolin, N. G.
    Pearton, S. J.
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2012, 30 (02):
  • [10] Neutron irradiation effects on gallium nitride-based Schottky diodes
    Lin, Chung-Han
    Katz, Evan J.
    Qiu, Jie
    Zhang, Zhichun
    Mishra, Umesh K.
    Cao, Lei
    Brillson, Leonard J.
    [J]. APPLIED PHYSICS LETTERS, 2013, 103 (16)