Interference of parametric X-ray and coherent Bremsstrahlung radiation from nonrelativistic electrons:: application to the phase analysis in crystallography

被引：2
|
作者：
Feranchuk, ID
Ulyanenkov, A
机构：
[1] Belarusian State Univ, Minsk 220050, BELARUS
[2] Bruker AXS, D-76187 Karlsruhe, Germany
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2001年 / 57卷
关键词：
D O I：
10.1107/S0108767300018584
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
The intensity of coherent X-radiation (CXR) from a relativistic electron beam interacting with the crystal [Feranchuk, Ulyanenkov, Harada & Spence (2000). Phys. Rev. E, 62, 4225-4234] is studied in view of its application to the phase determination problem. The analysis of CXR spectra is shown to permit an independent measurement of unit-cell structure factors, defined by both the electron-density distribution and the nucleus positions. In relation to these structure factors, two new types of Patterson function are introduced that can simplify the solution of crystal structure.
引用
收藏
页码：283 / 289
页数：7
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